EPC Releases 11th Reliability Report of GaN Devices Testing
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.
6 th
Apr 2020
Stan Lee2022-08-20T00:33:32+08:00Tags: EPC, gallium nitride, GaN, reports|
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.