EPC Releases 11th Reliability Report of GaN Devices Testing
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.
6 th
Apr 2020
dgecko_tech2020-04-22T15:57:13+08:00Tags: EPC, gallium nitride, GaN, reports|
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.