EPC Releases 11th Reliability Report of GaN Devices Testing
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.
6 th
Apr 2020
2 nd
Apr 2020
EPC Launches Update of Popular Video Podcast Series on Gallium Nitride (GaN) Power Transistors and Integrated Circuits
EPC posted the first half of a 14-part educational video podcast series on the theory, design basics and applications, such as lidar, DC-DC conversion, and wireless power using gallium nitride (GaN) FETs and ICs.