EPC Releases 11th Reliability Report of GaN Devices Testing
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.
dgecko_tech2020-04-22T15:57:13+08:00Tags: EPC, gallium nitride, GaN, reports|
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.
dgecko_tech2020-04-22T17:20:24+08:00Tags: EPC, gallium nitride, GaN, video|
EPC posted the first half of a 14-part educational video podcast series on the theory, design basics and applications, such as lidar, DC-DC conversion, and wireless power using gallium nitride (GaN) FETs and ICs.