EPC Releases 11th Reliability Report of GaN Devices Testing
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.
Stan Lee2022-08-20T00:33:32+08:00Tags: EPC, gallium nitride, GaN, reports|
EPC publishes 11th Reliability Report of GaN devices testing, demonstrating robustness unmatched by silicon power mosfet.
Stan Lee2022-08-20T00:33:25+08:00Tags: EPC, gallium nitride, GaN, video|
EPC posted the first half of a 14-part educational video podcast series on the theory, design basics and applications, such as lidar, DC-DC conversion, and wireless power using gallium nitride (GaN) FETs and ICs.
Stan Lee2022-08-20T00:33:19+08:00Tags: chip driver, EPC, GaN, integrated circuit|
EPC introduces the first of a new integrated circuit(IC) product family offering higher performance and smaller solution size for high power density application including DC-DC conversion, motor drive, and Class-D audio.